Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes.

Mathias Poik Mario Mayr Thomas Hackl Georg Schitter

Published in: I2MTC (2022)

Keyphrases

atomic force microscopy
dynamic environments
data sets
dynamically changing
wide range
data analysis
special case
knowledge base
data mining
real time
similarity measure
search algorithm
preprocessing
supply chain
manufacturing systems
highly dynamic
shop floor
dynamically updated