Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.

Fang Liu Sule Ozev

Published in: ICCD (2005)

Keyphrases

development process
software engineering
statistical analysis
development environment
case study
image analysis
design process
user centred design
website
data analysis
infrared
statistical tests
requirements engineering
software product line
analog circuits
analog vlsi