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Influence of channel layer and passivation layer on the stability of amorphous InGaZnO thin film transistors.

Runze ZhanChengyuan DongPo-Tsun LiuHan-Ping D. Shieh
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • thin film
  • multi layer
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  • application layer
  • power consumption
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