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Double electron capture in fast ion-atom collisions.

Saheb HalderSubhajit SamaddarKarunamoy PurkaitAbhoy MondalChittaranjan R. MandalMalay Purkait
Published in: J. Comput. Methods Sci. Eng. (2020)
Keyphrases
  • van der waals
  • high energy
  • real time
  • electron beam
  • information retrieval
  • genetic algorithm
  • multimedia
  • pattern recognition
  • image analysis
  • electric field