A stacking ensemble classifier with handcrafted and convolutional features for wafer map pattern classification.

Hyungu Kang Seokho Kang

Published in: Comput. Ind. (2021)

Keyphrases

pattern classification
feature extraction
ensemble classifier
pattern classification problems
ensemble learning
base classifiers
classification models
feature vectors
data sets
pattern recognition
data mining
decision trees
image registration
classification accuracy
random forest
high dimensional
computer vision