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Double Patterning Layout Decomposition for Simultaneous Conflict and Stitch Minimization.
Kun Yuan
Jae-Seok Yang
David Z. Pan
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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conflict resolution
field of view
objective function
decomposition method
decomposition algorithm
neural network
computer vision
layout design
information retrieval
image segmentation
panoramic images
cf loadingtexthtml
global minimization
resolving conflicts