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Counting the Number of Fault Patterns in Redundant VLSI Arrays.

Linda PagliGeppino Pucci
Published in: Inf. Process. Lett. (1994)
Keyphrases
  • small number
  • machine learning
  • information retrieval
  • artificial intelligence
  • artificial neural networks
  • fixed number
  • neural network
  • pattern recognition
  • fault detection
  • vlsi design