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TCAD simulation of trench-gate IGBTs for prediction of carrier lifetime requirements for future scaled devices.

Masahiro Watanabe
Published in: ASICON (2021)
Keyphrases
  • prediction accuracy
  • predicting future
  • user requirements
  • real time
  • neural network
  • long term
  • prediction error
  • real world
  • computer vision
  • low cost
  • smart phones
  • simulation models
  • data gathering
  • life span