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Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets.
Norbert Seifert
Shah M. Jahinuzzaman
Jyothi Velamala
Nikunj Patel
Published in:
IRPS (2015)
Keyphrases
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event detection
neural network
artificial intelligence
computer vision
information systems
information technology
low cost
event driven