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Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements.
Pablo Bodmann
George Papadimitriou
Rubens Luiz Rech Junior
Dimitris Gizopoulos
Paolo Rech
Published in:
IEEE Trans. Computers (2022)
Keyphrases
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single chip
low cost
measurement noise
error rate
high density
high speed
measurement errors
computing power
analog vlsi
measurement error
error bounds
low power
instruction set
level parallelism
database
circuit design
measurement data
generalization error
programmable logic