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Efficient Defect Identification via Oxide Memristive Crossbar Array Based Morphological Image Processing.

Hee Sung LeeYongmin BaekQiubao LinJoseph Minsu ChenMinseong ParkDoeon LeeSihwan KimKyusang Lee
Published in: Adv. Intell. Syst. (2021)
Keyphrases
  • morphological image processing
  • information systems
  • image processing
  • color images
  • lightweight
  • cost effective
  • scheduling algorithm
  • electron microscopy