Multiple shift-vector importance sampling method using support vector machine and clustering for high-density DRAM designs.
Jinyoung LeeSunghee YunJeongha KimDongsoo KangJeongyeol KimSanghoon LeePublished in: ISQED (2016)
Keyphrases
- high density
- support vector machine
- low density
- close proximity
- data center
- magnetic recording
- high power
- thin film
- magnetic tape
- high bandwidth
- clustering algorithm
- feature vectors
- multi class
- cluster analysis
- hierarchical clustering
- spectral clustering
- self organizing maps
- svm classifier
- k means
- training set
- databases
- cost effective
- real time
- low cost
- feature space
- support vector
- data sets