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Variations in Nanometer CMOS Flip-Flops: Part I - Impact of Process Variations on Timing.

Massimo AliotoElio ConsoliGaetano Palumbo
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
  • high speed
  • neural network
  • multi view
  • power consumption