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Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response.
Nuno Brito
Carlos Ferreira
Filipe Alves
Jorge Cabral
João Gaspar
João L. Monteiro
Luís A. Rocha
Published in:
Sensors (2016)
Keyphrases
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real time
databases
integrated circuit
levels of abstraction
database
high level
design considerations
platform independent
electrical properties