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On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages.
Daniela De Venuto
Michael J. Ohletz
Published in:
J. Electron. Test. (2001)
Keyphrases
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mixed signal
low power
low cost
multi channel
vlsi circuits
single chip
physical design
cmos technology
high speed
digital circuits
signal processor
embedded systems
circuit design
low voltage
general purpose
power dissipation
programmable logic
pattern recognition