A 130 nm CMOS 6-bit Full Nyquist 3 GS/s DAC.
Xu WuPieter PalmersMichiel S. J. SteyaertPublished in: IEEE J. Solid State Circuits (2008)
Keyphrases
- nm technology
- random access memory
- cmos technology
- power consumption
- silicon on insulator
- analog to digital converter
- low power
- metal oxide semiconductor
- sampling rate
- low cost
- high speed
- max csp
- low voltage
- vlsi circuits
- power supply
- parallel processing
- analog vlsi
- data sets
- flip flops
- cmos image sensor
- design considerations
- random number generator
- high resolution