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Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique.

Yangyang LiXiaojing LiBo LiLinchun GaoWeiwei YanFangfang WangDuoli LiChuanbin ZengJiajun LuoZhengsheng Han
Published in: IEEE Access (2019)
Keyphrases
  • data mining
  • data sets
  • infrared
  • web services
  • similarity measure
  • multi agent
  • power system