Classification of Experimental Errors Done in VISIR with Simple Alternated Current Circuits.
Lucas Nascimento MendonçaMayara MaçaneiroGustavo R. AlvesDanúbia Soares PiresJavier García ZubíaJordi CuadrosVanessa SerranoPublished in: EDUCON (2020)
Keyphrases
- automatic classification
- model selection
- object classification
- classification scheme
- unsupervised learning
- machine learning
- feature extraction
- pattern recognition
- classification accuracy
- pattern classification
- neural network
- classification systems
- classification rate
- support vector machine svm
- image classification
- feature selection
- benchmark datasets
- classification method
- text classification
- high speed
- support vector machine
- supervised classification
- data sets
- electronic circuits