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Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect.
Corrado De Sio
Sarah Azimi
Luca Sterpone
Boyang Du
Published in:
IEEE Access (2019)
Keyphrases
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x ray
infrared
steady state
error analysis
information systems
power consumption
image processing
evolutionary algorithm
low cost
low power
wave propagation
hardware software