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Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect.

Corrado De SioSarah AzimiLuca SterponeBoyang Du
Published in: IEEE Access (2019)
Keyphrases
  • x ray
  • infrared
  • steady state
  • error analysis
  • information systems
  • power consumption
  • image processing
  • evolutionary algorithm
  • low cost
  • low power
  • wave propagation
  • hardware software