Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant.
David AlvarezMichel J. Abou-KhalilChristian RussKiran V. ChattyRobert GauthierD. KontosJunjun LiChristopher SeguinRalph HalbachPublished in: Microelectron. Reliab. (2006)