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Fabrication of High Performance High Electron Mobility Transistor Design Based on III-V Compound Semiconductor.

Hla Myo TunMyat Su Nwe
Published in: RoViSP (2021)
Keyphrases
  • design process
  • high speed
  • integrated circuit
  • data sets
  • wide range
  • engineering design
  • electrical properties
  • real time
  • case study
  • design methodology
  • design space
  • high reliability