Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality.
Hiroshi OkaTakumi InabaShunsuke ShitakataKimihiko KatoShota IizukaHidehiro AsaiHiroshi FuketaTakahiro MoriPublished in: IEEE Access (2023)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- subband
- discrete wavelet transform
- wavelet coefficients
- wavelet analysis
- frequency band
- low pass
- electromagnetic fields
- high quality
- wavelet domain
- high frequency components
- dct domain
- higher quality
- image segmentation
- visual quality
- high resolution
- fusion rules
- spatial domain
- original images
- bit rate
- multiscale
- low and high frequency