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Optical nano artifact metrics using silicon random nanostructures.
Tsutomu Matsumoto
Naoki Yoshida
Shumpei Nishio
Morihisa Hoga
Yasuyuki Ohyagi
Naoya Tate
Makoto Naruse
Published in:
CoRR (2016)
Keyphrases
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liquid crystal
low cost
high speed
boundary conditions
high density
database
information retrieval
similarity measure
closely spaced
nano scale