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Investigation of STI edge effect on programming disturb in localized charge trapping SONOS flash memory cells.
Yue Xu
Feng Yan
ZhiGuo Li
Fan Yang
Jianguang Chang
Yonggang Wang
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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flash memory
garbage collection
solid state
file system
buffer management
main memory
embedded systems
random access
edge detection
hand held devices
storage devices
data storage
database systems
storage systems
storage management
high level
disk drives
real time