An Alternate Scattering-Type Parameter for Target Characterization and Classification.
Avik BhattacharyaAbhinav VermaSubhadip DeyAlejandro C. FreryPublished in: IEEE Trans. Geosci. Remote. Sens. (2024)
Keyphrases
- classification scheme
- classification systems
- automatic classification
- text classification
- machine learning
- pattern classification
- classification accuracy
- pattern recognition
- neural network
- classification rate
- supervised learning
- artificial neural networks
- support vector machine
- object classification
- feature selection
- classification algorithm
- classification method
- class labels
- supervised classification
- learning algorithm
- document classification
- decision trees
- classification rules
- machine learning methods
- training set
- benchmark datasets
- support vector machine svm
- unsupervised learning
- feature extraction
- nearest neighbor
- feature vectors
- high dimensional