Subblock-Level Matching Layout for Analog Block-Pair and Its Layout-Dependent Manufacturability Evaluation.
Takuya HirataRyuta NishinoShigetoshi NakatakeMasaya ShimoyamaMasashi MiyagawaRyoichi MiyauchiKoichi TannoAkihiro YamadaPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2016)