Ensemble Modeling of In Situ Features for Printed Electronics Manufacturing With In Situ Process Control Potential.
Yifu LiKaruniya MohanHongyue SunRan JinPublished in: IEEE Robotics Autom. Lett. (2017)
Keyphrases
- process control
- manufacturing process
- semiconductor manufacturing
- product quality
- individual features
- low level
- feature vectors
- classification accuracy
- feature set
- ensemble methods
- petri net
- manufacturing processes
- intelligent control
- extracted features
- manufacturing systems
- feature selection
- svm classifier
- class labels
- control system
- training set
- feature space