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An improved noise immune level-shifter via IGBT gate-emitter voltage detection [IEICE Electronics Express Vol. 15(2018) No. 9 pp. 20180293].

Hongyue ZhuDawei XuXinchang LiChao XuDengpeng WuXinhong ChengXiaoYun Li
Published in: IEICE Electron. Express (2018)
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