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A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues.

Koji NiiYasumasa TsukamotoYuichiro IshiiMakoto YabuuchiHidehiro FujiwaraKazuyoshi Okamoto
Published in: Asian Test Symposium (2012)
Keyphrases
  • high accuracy
  • similarity measure
  • data structure
  • database
  • data model
  • management system
  • software engineering
  • tree structure
  • high efficiency