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ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction.

Minsik ChoKun YuanYongchan BanDavid Z. Pan
Published in: DAC (2008)
Keyphrases
  • website
  • prediction error
  • database
  • databases
  • neural network
  • prediction accuracy
  • real world
  • learning algorithm
  • three dimensional
  • highly efficient
  • compact representations