Optimal schemes for resubmitted lot acceptance using previous defect count data.

Arturo J. Fernández

Published in: Comput. Ind. Eng. (2015)

Keyphrases

data sets
data collection
data processing
data points
data quality
original data
data distribution
data model
data sources
database
high quality
training data
statistical analysis
data mining
complex data
historical data
prior knowledge
sensor networks
feature selection
social networks