Arturo J. Fernández

Publication Activity (10 Years)

Years Active: 2006-2023
Publications (10 Years): 17

Top Topics

Prior Information

Top Venues

Comput. Ind. Eng.

IEEE Trans. Reliab.

Eur. J. Oper. Res.

J. Comput. Appl. Math.

Publications

Arturo J. Fernández
Optimal Confidence Regions for Weibull Parameters and Quantiles under Progressive Censoring. Algorithms 16 (9) (2023)
Arturo J. Fernández, Carlos J. Pérez-González, Andrés Carrión-García, Vicent Giner-Bosch
Overdispersion Effects on Reliability Test Planning. IEEE Trans. Reliab. 72 (3) (2023)
Arturo J. Fernández
Tolerance Limits and Sample-Size Determination Using Weibull Trimmed Data. Axioms 12 (4) (2023)
Arturo J. Fernández
Optimum lot inspection based on lognormal reliability tests. Int. J. Prod. Res. 61 (5) (2023)
Carlos J. Pérez-González, Arturo J. Fernández, Vicent Giner-Bosch, Andrés Carrión-García
Optimal repetitive reliability inspection of manufactured lots for lifetime models using prior information. Int. J. Prod. Res. 61 (7) (2023)
S. F. Bagheri, Akbar Asgharzadeh, Arturo J. Fernández, Carlos J. Pérez-González
Joint Prediction for Future Failures Times Under Type-II Censoring. IEEE Trans. Reliab. 71 (1) (2022)
Arturo J. Fernández
Planning reliability demonstration tests with limited expected risks. Comput. Ind. Eng. 165 (2022)
Arturo J. Fernández
Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios. Axioms 11 (11) (2022)
Arturo J. Fernández
Gamma Reliability Test Times With Minimal Costs and Limited Risks. IEEE Trans. Reliab. 71 (2) (2022)
Arturo J. Fernández
Optimal durations of Weibull reliability tests based on failure counts. Comput. Ind. Eng. 156 (2021)
Arturo J. Fernández, Carlos J. Pérez-González, M. Mercedes Suárez-Rancel
Optimal lot sentencing based on defective counts and prior acceptability. J. Comput. Appl. Math. 388 (2021)
Carlos J. Pérez-González, Arturo J. Fernández, Akram Kohansal
Efficient truncated repetitive lot inspection using Poisson defect counts and prior information. Eur. J. Oper. Res. 287 (3) (2020)
Arturo J. Fernández, Cristian D. Correa-Álvarez, Luis R. Pericchi
Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design. Eur. J. Oper. Res. 286 (2) (2020)
Arturo J. Fernández
Explicit lot inspection by attributes using minimal prior information. Comput. Ind. Eng. 148 (2020)
Arturo J. Fernández
Optimal attribute sampling plans in closed-forms. Comput. Ind. Eng. 137 (2019)
Arturo J. Fernández, Carlos J. Pérez-González, Akram Kohansal
Improved time-censored reliability test plans for k-out-of-n gamma systems. J. Comput. Appl. Math. 361 (2019)
Arturo J. Fernández
Economic lot sampling inspection from defect counts with minimum conditional value-at-risk. Eur. J. Oper. Res. 258 (2) (2017)
Arturo J. Fernández
Optimal schemes for resubmitted lot acceptance using previous defect count data. Comput. Ind. Eng. 87 (2015)
Arturo J. Fernández
Optimum attributes component test plans for k-out-of-n: F Weibull systems using prior information. Eur. J. Oper. Res. 240 (3) (2015)
Arturo J. Fernández
Computing optimal confidence sets for Pareto models under progressive censoring. J. Comput. Appl. Math. 258 (2014)
Arturo J. Fernández
Optimal Defects-Per-Unit Acceptance Sampling Plans Using Truncated Prior Distributions. IEEE Trans. Reliab. 63 (2) (2014)
Arturo J. Fernández
Smallest Pareto confidence regions and applications. Comput. Stat. Data Anal. 62 (2013)
Carlos J. Pérez-González, Arturo J. Fernández
Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis. Comput. Stat. 28 (3) (2013)
Arturo J. Fernández, Carlos J. Pérez-González
Generalized beta prior models on fraction defective in reliability test planning. J. Comput. Appl. Math. 236 (13) (2012)
Arturo J. Fernández
Minimizing the area of a Pareto confidence region. Eur. J. Oper. Res. 221 (1) (2012)
Arturo J. Fernández, Carlos J. Pérez-González
Optimal acceptance sampling plans for log-location-scale lifetime models using average risks. Comput. Stat. Data Anal. 56 (3) (2012)
Arturo J. Fernández
Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed Components. IEEE Trans. Reliab. 60 (4) (2011)
Arturo J. Fernández, Carlos J. Pérez-González, Muhammad Aslam, Chi-Hyuck Jun
Design of progressively censored group sampling plans for Weibull distributions: An optimization problem. Eur. J. Oper. Res. 211 (3) (2011)
Arturo J. Fernández
Two-sided tolerance intervals in the exponential case: Corrigenda and generalizations. Comput. Stat. Data Anal. 54 (1) (2010)
Arturo J. Fernández
Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes. IEEE Trans. Reliab. 59 (2) (2010)
Arturo J. Fernández
Reliability inference and sample-size determination under double censoring for some two-parameter models. Comput. Stat. Data Anal. 52 (7) (2008)
Arturo J. Fernández
Bounding maximum likelihood estimates based on incomplete ordered data. Comput. Stat. Data Anal. 50 (8) (2006)
Arturo J. Fernández
Bayesian estimation based on trimmed samples from Pareto populations. Comput. Stat. Data Anal. 51 (2) (2006)