Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features.

Bing Long Shulin Tian Houjun Wang

Published in: J. Electron. Test. (2012)

Keyphrases

analog circuits
ls svm
least squares support vector machine
least squares
feature vectors
feature extraction
expert systems
digital circuits
prior knowledge
cross validation
machine learning
genetic algorithm
computer vision
feature set
svm classifier
data fusion