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Statistical analysis of topographic images of nanoporous silicon and model surfaces.

J. B. da Silva Jr.Elder A. de VasconcelosB. E. C. A. dos SantosJ. A. K. FreireV. N. FreireG. A. FariasEronides Felisberto da Silva Júnior
Published in: Microelectron. J. (2005)
Keyphrases
  • statistical analysis
  • three dimensional
  • probabilistic model
  • high level
  • image retrieval
  • image registration
  • image classification
  • segmentation algorithm
  • lighting conditions
  • surface model
  • geometric models