Login / Signup

Degradation of the DC current capability in long-emitter bipolar transistors.

Francesco CarraraTonio BiondiAntonino ScuderiGiuseppe Palmisano
Published in: ICECS (2002)
Keyphrases
  • high density
  • thin film
  • positive and negative
  • high power
  • real world
  • learning algorithm
  • knowledge base
  • case study
  • video sequences
  • low power