A method of diagnosing single stuck-at faults in combinational circuits.
Teruhiko YamadaYoshiyuki NakamuraPublished in: Systems and Computers in Japan (1992)
Keyphrases
- synthetic data
- cost function
- significant improvement
- similarity measure
- detection method
- optimization algorithm
- mutual information
- high accuracy
- computational cost
- prior knowledge
- classification method
- computational complexity
- fully automatic
- pairwise
- support vector machine
- high precision
- multiscale
- theoretical analysis
- probabilistic model
- clustering method
- data sets
- preprocessing
- objective function
- image sequences