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Temperature Dependence of the Electron and Hole Scattering Mechanisms in Silicon Analyzed through a Full-Band, Spherical-Harmonics Solution of the BTE.

Susanna ReggianiMaria Cristina VecchiMassimo Rudan
Published in: VLSI Design (1998)
Keyphrases
  • spherical harmonics
  • fokker planck equation
  • single image
  • image processing
  • shape representation
  • electric field
  • range data
  • cross correlation
  • viewpoint
  • least squares