Reverse Engineering Flash EEPROM Memories Using Scanning Electron Microscopy.
Franck CourbonSergei SkorobogatovChristopher WoodsPublished in: CARDIS (2016)
Keyphrases
- reverse engineering
- electron microscopy
- low energy
- x ray
- image stacks
- software engineering
- software maintenance
- object oriented
- thin film
- dynamic analysis
- reverse engineer
- gene regulatory networks
- computer aided design
- conceptual schema
- program understanding
- business rules
- legacy systems
- software evolution
- platform independent
- fine grained
- artificial intelligence
- neural network
- machine learning