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A comprehensive approach to modeling, characterizing and optimizing for metastability in FPGAs.

Doris ChenDeshanand P. SinghJeffrey ChromczakDavid M. LewisRyan FungDavid NetoVaughn Betz
Published in: FPGA (2010)
Keyphrases
  • modeling method
  • real world
  • machine learning
  • decision making
  • high level
  • pattern recognition
  • hardware and software