Yield, Area, and Energy Optimization in STT-MRAMs Using Failure-Aware ECC.
Zoha PajouhiXuanyao FongAnand RaghunathanKaushik RoyPublished in: ACM J. Emerg. Technol. Comput. Syst. (2016)
Keyphrases
- global optimization
- optimization algorithm
- error correction
- failure modes
- optimization process
- optimization problems
- optimization strategies
- optimization method
- energy minimization
- constrained optimization
- case study
- security analysis
- optimization model
- energy consumption
- smart card
- combinatorial optimization
- root cause
- error correcting
- data sets
- success or failure
- failure detection