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Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation.

Wangyang ZhangXin LiEmrah AcarFrank LiuRob A. Rutenbar
Published in: ICCAD (2010)
Keyphrases
  • minimum cost
  • semiconductor manufacturing
  • integrated circuit
  • massively parallel
  • virtual environment
  • special case
  • np hard
  • spanning tree
  • network flow problem
  • optimal solution
  • approximation algorithms