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Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology.

Ming-Hung WengChao-Hung ChenChe-Kai LinShih-Hui HuangJhih-Han DuSheng-Wen PengWalter WohlmuthFrank Yung-Shi ChouChang-Hwang Hua
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • cost effective
  • edge detection
  • high reliability
  • graphical models
  • rapid development
  • key technologies
  • case study
  • probabilistic inference
  • st century
  • data processing
  • computer systems
  • edge information