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Significance testing for genomic mismatch scanning.

Gregory R. GrantR. S. SpielmanElisabetta ManduchiVivian G. CheungWarren J. Ewens
Published in: RECOMB (1999)
Keyphrases
  • high throughput
  • neural network
  • test generation
  • scan data
  • information retrieval
  • feature selection
  • image processing
  • three dimensional
  • data structure
  • search algorithm
  • pairwise
  • test set
  • sequence data
  • software testing