Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology.
Thomas KuenzigGabriele SchragJacopo IannacciPublished in: Microelectron. Reliab. (2012)
Keyphrases
- high reliability
- remote control
- high precision
- low cost
- discrete event simulation
- low overhead
- computational model
- rapid development
- key technologies
- real time
- case study
- radio frequency
- simulation environment
- simulation model
- crowd simulation
- mathematical modeling
- numerical simulations
- simulation study
- mathematical models
- technological advances
- selection mechanism
- access control
- data processing
- information technology
- multi agent systems
- information systems
- social simulation
- genetic algorithm