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IGBT module failure analysis in railway applications.

X. PerpiñàJean-François ServiereXavier JordàA. FauquetSalvador HidalgoJesús Urresti-IbañezJosé RebolloMichel Mermet-Guyennet
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • statistical analysis
  • feature selection
  • knowledge base
  • small size