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VirtualScan: A New Compressed Scan Technology for Test Cost Reduction.
Laung-Terng Wang
Khader S. Abdel-Hafez
Shianling Wu
Xiaoqing Wen
Hiroshi Furukawa
Fei-Sheng Hsu
Shyh-Horng Lin
Sen-Wei Tsai
Published in:
ITC (2004)
Keyphrases
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cost reduction
cost savings
data structure
data compression
lead time
compressed domain
case study
sufficient conditions