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A 20-b ± 40-mV Range Read-Out IC With 50-nV Offset and 0.04% Gain Error for Bridge Transducers.
Rong Wu
Youngcheol Chae
Johan H. Huijsing
Kofi A. A. Makinwa
Published in:
IEEE J. Solid State Circuits (2012)
Keyphrases
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wide range
integrated circuit
error rate
error bounds
finite automata
case study
generalization error
error analysis
linear complexity
real world
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database systems
search algorithm
range data