Prediction of Key Metrics of Stacked Nanosheet nFETs using Genetic Algorithm-based Neural Networks.
Haoqing XuWeizhuo GanLei CaoHuaxiang YinZhenhua WuPublished in: ICTA (2022)
Keyphrases
- neural network
- prediction accuracy
- prediction model
- neural network ensemble
- artificial neural networks to predict
- fuzzy systems
- pattern recognition
- fuzzy logic
- back propagation
- network architecture
- genetic algorithm
- neural networks and support vector machines
- learning algorithm
- gaussian process models
- similarity metrics
- decision making
- prediction error
- feed forward
- fault diagnosis
- artificial neural networks
- evaluation methods
- rule extraction
- competitive learning
- prediction algorithm
- software engineering