11.4 1650µm2 thermal-diffusivity sensors with inaccuracies down to ±0.75°C in 40nm CMOS.
Ugur SonmezFabio SebastianoKofi A. A. MakinwaPublished in: ISSCC (2016)
Keyphrases
- focal plane
- infrared
- cmos technology
- image sensor
- silicon on insulator
- sensor networks
- power consumption
- low power
- nm technology
- metal oxide semiconductor
- multi sensor
- infrared sensors
- high speed
- data fusion
- sensor data
- analog vlsi
- low cost
- sensor technology
- mobile robot
- nonlinear diffusion
- visible spectrum
- real time
- wireless sensor networks
- sensor fusion
- power supply
- circuit design
- image processing algorithms
- vlsi circuits
- transmission electron microscopy
- power plant
- image enhancement
- x ray
- scale space