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An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD.

Shuhei FukunagaTsuyoshi FunakiShinsuke HaradaYusuke Kobayashi
Published in: IEICE Electron. Express (2019)
Keyphrases
  • case study
  • dynamic environments
  • estimation algorithm
  • maximum likelihood estimation
  • databases
  • image processing
  • image sequences
  • evolutionary algorithm
  • parameter estimation
  • monte carlo simulation